Part Number X28256DMB-25 described as Microcircuit Memory with NSN 5962-01-499-6901 with FSC 5962 Microcircuits Electronic by Manufacture Xicor Ltd is available in stock. We provide comprehensive database of aerospace and aviation components, sub-assemblies, and completed assemblies allows us to respond to your RFQ within 15 minutes.
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NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-01-499-6901 Item Description: Microcircuit Memory | 5962 | 014996901 | N | A | ||
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
A | A | 0 | ||||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
X28256dmb-25 | 5 | 2 | 3 |
MRC | Criteria | Characteristic |
---|---|---|
MRC | Decoded Requirement | Clear Text Reply |
CQWX | Output Logic Form | N-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
CTQX | Current Rating Per Characteristic | 120.00 MILLIAMPERES REVERSE CURRENT, DC ABSOLUTE |
CZER | Memory Device Type | EEPROM |
CQZP | Input Circuit Pattern | 26 INPUT |
CQSJ | Inclosure Material | CERAMIC |
ADAT | Body Width | 0.500 INCHES MINIMUM AND 0.610 INCHES MAXIMUM |
CBBL | Features Provided | HERMETICALLY SEALED AND BURN IN AND MONOLITHIC AND POSITIVE OUTPUTS |
AFGA | Operating Temp Range | -55.0/+125.0 DEG CELSIUS |
CQSZ | Inclosure Configuration | DUAL-IN-LINE |
ADAQ | Body Length | 1.490 INCHES MAXIMUM |
ADAU | Body Height | 0.217 INCHES MAXIMUM |
TEST | Test Data Document | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
CTFT | Case Outline Source And Designator | D-10 MIL-M-38510 |
NHCF | Nuclear Hardness Critical Feature | HARDENED |
TTQY | Terminal Type And Quantity | 28 PRINTED CIRCUIT |
CZEP | Capitance Rating Per Characteristic | 6.00 INPUT PICOFARADS MAXIMUM AND 10.00 OUTPUT PICOFARADS MAXIMUM |
CWSG | Terminal Surface Treatment | SOLDER |
FEAT | Special Features | NUCLEAR HARDNESS CRITICAL ITEM |
CZEN | Voltage Rating And Type Per Characteristic | -1.0 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
CZEQ | Time Rating Per Chacteristic | 250.00 NANOSECONDS MAXIMUM ACCESS |
AFJQ | Storage Temp Range | -65.0/+150.0 DEG CELSIUS |
CRTL | Criticality Code Justification | FEAT |
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